접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
Handy type
비접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
캐리어 라이프타임측정기
웨이퍼 Flatness / Resistivity
PN판정기
웨이퍼 두께측정기
Manual Type
Semi Auto Type
프로브헤드
확산저항측정기(SRP)
이미지센서 CIS 테스터
표준샘플
비접촉식 면저항측정기 제품별 > 비접촉식 면저항측정기
Built-in module of resistivity for semicoductor by eddy current method (Non-contact)
NC-110 (NC-110PV)
- Res : 0.1~15 Ω•cm
- Rs : 5~750 Ω/sq
- Thickness : 100~500 μm
- Applications : Silicon wafer (Mono-crystalline, Poly-crystalline)
- Wafer sizes : 126, 156, 210mmSQ (PSQ)



- In-line on-the-fly measurement module for solar silicon wafer

- Possilble to measure Resistivity and/or Thickness by each module without contact

- PN type checker module (option)