::냅슨코리아(주)::

접촉식 면저항측정기

비접촉식 면저항측정기

캐리어 라이프타임측정기

웨이퍼 Flatness / Resistivity

웨이퍼 두께측정기

프로브헤드

확산저항측정기(SRP)

이미지센서 CIS 테스터

장비통합솔루션(측정모듈)

제품별

제품별


	Vertical type Rs measurement system
	NC-1000
	- Rs : 3Ω/sq~2000Ω/sq or 3mΩ/sq~1Ω/sq (option : up to 3000Ω/sq) - Applications : Conductive layer on glass TFT, EL(OLED), CF, Metal thin film, n+a-Si layer, Solar cell - Glass sizes : up to 500mm x 500mm and thickness 0.5~1T
	- High pecision measurement for Conductive layer on glass substrate with non-contact eddy current sensor - Muti-points measurement with 3 sensors - Layers thickness direct read out with software - 2-D, 3-D mapping software