::냅슨코리아(주)::

접촉식 면저항측정기

비접촉식 면저항측정기

캐리어 라이프타임측정기

웨이퍼 Flatness / Resistivity

웨이퍼 두께측정기

프로브헤드

확산저항측정기(SRP)

이미지센서 CIS 테스터

장비통합솔루션(측정모듈)

제품별

제품별


	Full Auto wafer sorting system
	NC-6800Ｍ
	- Res : 0.001∼60Ω·cm - Thickness : 150∼800μm - PN : 0.1~1000Ω·cm in resistivity - Applications : Silicon wafer, GaP, nd InP - Wafer sizes : 3"~5"Ф (square samples are available)
	- High precision and high speed wafer resistivity measuring system with non-contact eddy current probes - Max. 300 pieces of wafer are stackable (with non-cassette) on loader and automatically loading to measuring position wih electric static absortion