접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
Handy type
비접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
캐리어 라이프타임측정기
웨이퍼 Flatness / Resistivity
PN판정기
웨이퍼 두께측정기
Manual Type
Semi Auto Type
프로브헤드
확산저항측정기(SRP)
이미지센서 CIS 테스터
표준샘플
장비통합솔루션(측정모듈)
접촉식 면저항
비접촉식 면저항
PN판정
제품별 제품별
Full Auto wafer sorting system
NC-80T
- Res : 0.001∼60Ω·cm
- Thickness : 150∼800μm
- PN : 0.1~1000Ω·cm in resistivity
- Applications : Silicon wafer (Raw slice, Lapped, Mirror, Etched, Polished)
- Wafer sizes : Contact us in details


- Hgh precision and high speed silicon wafer thickness sorting system with non-contact electric capacitance probe / meter

- 1 point / 5 points measurement (option : 9 points and more)

- High tact 9 seconds / 5 points /wafer

- Resolution : 0.1μm

- The number of cassettes on loader and unloader is designed by specfications