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 제품별 |
 제품별 |
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Semi-auto Rs/Res. measurement system |
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RG-100PV |
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- Rs : 1m~1000k Ω/sq (option : ~10M Ω/sq)
- Res : 1m~200 Ω•cm
- Applications : Silicon wafer, conductive layer on glass/film and more
- Sample sizes : Up to 300mmSQ (opton : 500mmSQ) |
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- Semi-auto 4 point probe system for solar cell, thinfilm on substrate samples multi-point measurement
- Even pitch and random pitch for Max.1000points
- 2-D/3-D squre mapping software for even pitch
- 2-D pseude squre mapping software (option)
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