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Napson Corporation 제조사별 > Napson Corporation
Non-contact sheet resistance mapping system
NC-300SCAN
- Rs : 0.05~2 Ω/sq
- Applications : Cu film on silicon wafer (silicon wafer t : approx. 750μm) ...
Manual resistivity, thickness, PN measurement...
EC-80TPN
- Rs : 0.01~3000 Ω/sq
- Res : 0.001~200 Ω·cm
- Thickness : 150~250 μm 
- Applications : Si...
Manual Res/thickness measurement system
EC-80SCAN
- Rs : 0.01~3000 Ω/sq
- Res : 0.001~200 Ω·cm
- Thickness : 150~350 μm or 350~750 μm 
- Ap...
Full Auto Rs measurement system
WS-3000
- Res : 1μ~1MΩ·cm
- Rs : 1m~10M Ω/sq (option : 1G Ω/sq)
- Applications : Silicon wafer, Sem...

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