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Full Auto Rs measurement system
NC-600MAP
- Measuring range : 1~3000 Ω/sq (option : 5mΩ/sq ~)
- Applicatons : Silicon wafer, GaAs Epi, GaN...
Full Auto wafer sorting system
NC-6800
- Res : 0.001∼60Ω·cm
- Thickness : 150∼800μm
- PN : 0.1~1000Ω·cm in resistivity
- Appli...
Full Auto wafer sorting system
NC-3000Ｒ
- Res : 0.001∼60Ω·cm
- Thickness : 150∼800μm
- PN : 0.1~1000Ω·cm in resistivity
- Appli...
Semi-auto Res/thickness measurement system
NC-20
- Rs : 0.01~3,000Ω/sq
- Res : 0.001~200Ω·cm
- Applications : Silicon wafer, Solar cell (S...

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