접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
Handy type
비접촉식 면저항측정기
Manual Type
Semi Auto Type
Full Auto Type
In-line Type
Handy type
캐리어 라이프타임측정기
웨이퍼 Flatness / Resistivity
PN판정기
웨이퍼 두께측정기
Manual Type
Semi Auto Type
프로브헤드
확산저항측정기(SRP)
이미지센서 CIS 테스터
표준샘플
장비통합솔루션(측정모듈)
접촉식 면저항
비접촉식 면저항
PN판정
Semi Auto Type 제품별 > 비접촉식 면저항측정기 > Semi Auto Type
Non-contact sheet resistance mapping system
NC-300SCAN
- Rs : 0.05~2 Ω/sq
- Applications : Cu film on silicon wafer (silicon wafer t : approx. 750μm)
...
Semi-auto Rs/Res. measurement instrument
NC-10
- Rs : 0.01~3000Ω/sq
- Res : 0.001~200Ω·cm
- Applications : Silicon wafer, GaAs Epi, GaN, GaP, ...
Semi-auto Res/thickness measurement system
NC-20
- Rs : 0.01~3,000Ω/sq
- Res : 0.001~200Ω·cm
- Applications : Silicon wafer, Solar cell (S...
Non-contact Ultra-High range Rs measurement s...
CRN-100
- Rs : 10E+9 ~ 10E+15 Ω/sq
- Applications : Any sample within the measurement range can be measur...

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